臺式(shi)雙(shuang)面電(dian)(dian)(dian)池(chi)(chi)PID測試儀用(yong)于單面及雙(shuang)面電(dian)(dian)(dian)池(chi)(chi),HIT、Topcon、PERC/PERC+太(tai)陽(yang)能(neng)(neng)電(dian)(dian)(dian)池(chi)(chi)、晶(jing)體硅太(tai)陽(yang)能(neng)(neng)電(dian)(dian)(dian)池(chi)(chi)、微(wei)型(xing)模(mo)塊等的(de)(de)(de)質量控(kong)制Freiberg公(gong)司與德國FraunhoferCSP公(gong)司合作開發了一種可作為商業(ye)應(ying)用(yong)的(de)(de)(de)臺式(shi)太(tai)陽(yang)能(neng)(neng)電(dian)(dian)(dian)池(chi)(chi)和(he)微(wei)型(xing)模(mo)塊的(de)(de)(de)電(dian)(dian)(dian)勢(shi)誘(you)導退控(kong)制的(de)(de)(de)測量解決方案(an)
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